Category: Thickness Monitor SQM160

The SQM-160 employs quartz crystal sensor technology to precisely measure rate and thickness during thin film deposition processes, with standard provision for two sensor inputs and optional expansion for four more.

It offers two recorder outputs for analog rate and thickness signals, allowing for enhanced monitoring and control. Sensor inputs can be allocated to different materials, averaged for accuracy in larger systems, or configured for dual-sensor setups, while the rate sampling mode prolongs sensor life in high-rate processes.

Users can select rate displays of either 0.1Å/s or 0.01Å/s, and choose between Frequency or Mass displays. Analog outputs for rate/thickness recording are provided, and an optional high-resolution mode offers 0.03Hz resolution at 10 readings per second, with RS-232 connectivity standard and optional USB or Ethernet interfaces.